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Henry Chen received his Ph.D. degree from the University of
Minnesota, Minneapolis, in 1989, in electrical engineering. Since
joining Wright State University in 1989 he has worked primarily in VLSI
design and test of digital, mixed-signal IC and system-on-a-chip (SoC);
VLSI and FPGA instrumentation and measurement for communications, global
positioning systems, and digital wideband microwave receivers. His
research was supported by DoD, Federal agencies, industrial companies
and the state of Ohio. He has written over 90 publications on IEEE
journals, international journals and IEEE conference proceedings. He
has been technical committee members of IEEE International ASIC/SOC
Conference, IEEE Instrumentation and Measurement Technology Conference,
Annual Conference of the IEEE Industrial Electronics, and IEEE
International Symposium on Circuits and Systems. He was a plenary
speaker in the 6th VLSI Design/CAD Symposium and served as a Guest
Editor of VLSI Design Journal in 2002. He has consulted for a number of
US semiconductor companies.
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